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[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Mutation analysis for Lustre programs: Fault model description and validation

✍ Scribed by du Bousquet, Lydie; Delaunay, Michel

Book ID: 126605222
Publisher: IEEE
Year: 2007
Weight: 300 KB
Category: Article
ISBN-13: 9780769529844
DOI: 10.1109/TAIC.PART.2007.27

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