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[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Mutation Analysis for Security Tests Qualification

✍ Scribed by Mouelhi, Tejeddine; Le Traon, Yves; Baudry, Benoit

Book ID: 120298996
Publisher: IEEE
Year: 2007
Weight: 502 KB
Category: Article
ISBN-13: 9780769529844
DOI: 10.1109/TAIC.PART.2007.21

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