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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Method of diagnosing FPGA with use of geometrical images

✍ Scribed by Epifanov, A.S.

No coin nor oath required. For personal study only.

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