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[IEEE Test Symposium (EWDTS) - Sevastopol, Ukraine (2011.09.9-2011.09.12)] 2011 9th East-West Design & Test Symposium (EWDTS) - Si BJT and SiGe HBT performance modeling after neutron radiation exposure

✍ Scribed by Petrosyants, Konstantin; Vologdin, Eric; Smirnov, Dmitry; Torgovnikov, Rostislav; Kozhukhov, Maxim

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