[IEEE Test Symposium (EWDTS) - Sevastopol, Ukraine (2011.09.9-2011.09.12)] 2011 9th East-West Design & Test Symposium (EWDTS) - Compact DSM MOSFET model and its parameters extraction

✍ Scribed by Belous, Anatoly; Nelayev, Vladislav; Shvedov, Sergey; Stempitsky, Viktor; Tran Tuan Trung, ; Turtsevich, Arkady

• Book ID: 118069826
• Publisher: IEEE
• Year: 2011
• Weight: 360 KB
• Volume: 0
• Category: Article
• ISBN: 1457719568
• DOI: 10.1109/ewdts.2011.6116414