𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - Electron beam damage of advanced silicon bipolar transistors and circuits

✍ Scribed by Jenkins, K.A.; Cressler, J.D.

Book ID: 125500887
Publisher: IEEE
Year: 1988
Weight: 210 KB
Category: Article
DOI: 10.1109/IEDM.1988.32742

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