✦ LIBER ✦

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - Flicker noise characteristics of advanced MOS technologies

✍ Scribed by Hung, K.K.; Ko, P.K.; Hu, C.; Cheng, Y.C.

No coin nor oath required. For personal study only.

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