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[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - A High-Performance SRAM Technology With Reduced Chip-Level Routing Congestion for SoC

✍ Scribed by Castagnetti, R.; Venkatraman, R.; Bartz, B.; Monzel, C.; Briscoe, T.; Teene, A.; Ramesh, S.

Book ID: 120298935
Publisher: IEEE
Year: 2005
Weight: 258 KB
Category: Article
ISBN-13: 9780769523019
DOI: 10.1109/ISQED.2005.6

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