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[IEEE Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Austin, TX, USA (2006.12.4-2006.12.5)] Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Advanced SAT-Techniques for Bounded Model Checking of Blackbox Designs

✍ Scribed by Herbstritt, Marc; Becker, Bernd; Scholl, Christoph

Book ID: 126667115
Publisher: IEEE
Year: 2006
Weight: 229 KB
Category: Article
ISBN-13: 9780769528397
DOI: 10.1109/MTV.2006.3

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