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[IEEE Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Austin, TX, USA (2006.12.4-2006.12.5)] Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Test Calculation for Logic and Delay Faults in Digital Circuits

✍ Scribed by Sziray, Jozsef

Book ID: 120552496
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 389 KB
Category: Article
ISBN-13: 9780769528397
DOI: 10.1109/MTV.2006.21

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