[IEEE 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions - Austin, TX, USA (29-30 May 2003)] Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions - Definition of a systematic method for the generation of software test programs allowing the functional verification of system on chip (SoC)

✍ Scribed by Hunsinger, F.; Francois, S.; Jerraya, A.A.

• Book ID: 115525681
• Publisher: IEEE
• Year: 2003
• Weight: 237 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780769520452
• DOI: 10.1109/mtv.2003.1250257