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[IEEE RAMS '06. Annual Reliability and Maintainability Symposium, 2006. - Newport Beach, CA, USA (23-26 Jan. 2006)] RAMS '06. Annual Reliability and Maintainability Symposium, 2006. - Bayesian estimation in accelerated life testing application on exponential-arrhenius model

✍ Scribed by Voiculescu, S.; Guerin, F.; Charki, A.

Book ID: 120050992
Publisher: IEEE
Year: 2006
Weight: 479 KB
Category: Article
ISBN-13: 9781424400072
DOI: 10.1109/RAMS.2006.1677395

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