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[IEEE RAMS '06. Annual Reliability and Maintainability Symposium, 2006. - Newport Beach, CA, USA (23-26 Jan. 2006)] RAMS '06. Annual Reliability and Maintainability Symposium, 2006. - Microstructural-based physics of failure models to predict fatigue reliability

✍ Scribed by Tryon, R.G.; Dey, A.; Krishnan, G.; Yaowu Zhao,

Book ID: 121082039
Publisher: IEEE
Year: 2006
Weight: 518 KB
Category: Article
ISBN-13: 9781424400072
DOI: 10.1109/RAMS.2006.1677426

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