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[IEEE RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - St. Malo, France (13-16 Sept. 1993)] RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - Single event gate rupture in commercial power MOSFETs

✍ Scribed by Nichols, D.K.; Coss, J.R.; McCarty, K.P.

Book ID: 125885882
Publisher: IEEE
Year: 1994
Weight: 472 KB
Category: Article
ISBN-13: 9780780317932
DOI: 10.1109/RADECS.1993.316559

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