𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings. Seventh IEEE/CHMT International Electronic Manufacturing Technology Symposium - San Francisco, CA, USA (25-27 Sept. 1989)] Proceedings. Seventh IEEE/CHMT International Electronic Manufacturing Technology Symposium - Effects of material and process on the reliability of very small hermetic microwave packages

✍ Scribed by Lian-Mueller, L.B.; Lau, J.H.

Book ID: 126738346
Publisher: IEEE
Year: 1989
Weight: 441 KB
Category: Article
DOI: 10.1109/EMTS.1989.68996

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