𝔖 Bobbio Scriptorium

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[IEEE Proceedings., Second Annual IEEE ASIC Seminar and Exhibit - Rochester, NY, USA (25-28 Sept. 1989)] Proceedings., Second Annual IEEE ASIC Seminar and Exhibit - Fault grading, a measure of logic simulation integrity

✍ Scribed by Greggain, L.; White, B.

Book ID: 126697569
Publisher: IEEE
Year: 1989
Weight: 394 KB
Category: Article
DOI: 10.1109/ASIC.1989.123222

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