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[IEEE Proceedings., Second Annual IEEE ASIC Seminar and Exhibit - Rochester, NY, USA (25-28 Sept. 1989)] Proceedings., Second Annual IEEE ASIC Seminar and Exhibit - Composite device model enhances worst case simulation of bipolar analog ASICs

✍ Scribed by Bray, D.

Book ID: 126671297
Publisher: IEEE
Year: 1989
Weight: 258 KB
Category: Article
DOI: 10.1109/ASIC.1989.123244

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