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[IEEE Proceedings of the IEEE 2004 Custom Integrated Circuits Conference - Orlando, FL, USA (3-6 Oct. 2004)] Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) - A digital DFT technique for verifying the static performance of A/D converters

✍ Scribed by Choi, W.; Vinnakota, B.; Harjani, R.

Book ID: 126675875
Publisher: IEEE
Year: 2004
Weight: 484 KB
Category: Article
ISBN-13: 9780780384958
DOI: 10.1109/CICC.2004.1358778

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