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[IEEE Proceedings of the IEEE 2004 Custom Integrated Circuits Conference - Orlando, FL, USA (3-6 Oct. 2004)] Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) - RF distortion analysis with compact MOSFET models

✍ Scribed by Bendix, P.; Rakers, P.; Wagh, P.; Lemaitre, L.; Grabinski, W.; McAndrew, C.C.; Gu, X.; Gildenblat, G.

Book ID: 118166972
Publisher: IEEE
Year: 2004
Weight: 326 KB
Volume: 0
Category: Article
ISBN-13: 9780780384958
DOI: 10.1109/cicc.2004.1358719

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