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[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Improvement of detectability for CMOS floating gate defects in supply current test

✍ Scribed by Michinishi, ; Yokohira, ; Okamoto, ; Kobayashi, ; Hondo,

Book ID: 126761459
Publisher: IEEE
Year: 2003
Weight: 431 KB
Category: Article
ISBN-13: 9780769519517
DOI: 10.1109/ATS.2003.1250846

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