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[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Fault diagnosis for physical defects of unknown behaviors

✍ Scribed by Wen, ; Tamamoto, ; Salu, ; Kinoshita,

Book ID: 126680946
Publisher: IEEE
Year: 2003
Weight: 273 KB
Category: Article
ISBN-13: 9780769519517
DOI: 10.1109/ATS.2003.1250816

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