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[IEEE Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004. - Toulouse, France (July 5-9, 2004)] Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004. - Field distribution measurement and simulation of stress control materials for cable accessories

✍ Scribed by Bayon, L.; Buret, F.; Koelblin, C.; Toledo, T.

Book ID: 124158988
Publisher: IEEE
Year: 2004
Weight: 315 KB
Volume: 2
Category: Article
ISBN-13: 9780780383487
DOI: 10.1109/ICSD.2004.1350486

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