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[IEEE Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004. - Toulouse, France (July 5-9, 2004)] Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004. - Measurement and modeling of charge profiles in irradiated dielectrics

✍ Scribed by Inguimbert, C.; Carrere, Y.; Griseri, V.; Dirassen, B.; Levy, L.; Payan, D.; Fakunaga, K.

Book ID: 120265456
Publisher: IEEE
Year: 2004
Weight: 300 KB
Volume: 2
Category: Article
ISBN-13: 9780780383487
DOI: 10.1109/ICSD.2004.1350589

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