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[IEEE Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International Electronic Manufacturing Technology Symposium - Nara, Japan (26-28 April 1989)] Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International Electronic Manufacturing Technology Symposium - Variation of acoustic impedance caused by a cut in ultrasonic transducers

✍ Scribed by Watanabe, K.; Iida, A.; Namiki, F.; Kawabe, K.; Shimura, T.

Book ID: 126224212
Publisher: IEEE
Year: 1989
Weight: 275 KB
Category: Article
DOI: 10.1109/IEMTS.1989.76159

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