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[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Improving accuracy and flexibility of ASTM D 5470 for high performance thermal interface materials

✍ Scribed by Kearns, D.

Book ID: 120232806
Publisher: IEEE
Year: 2003
Weight: 505 KB
Category: Article
ISBN-13: 9780780377936
DOI: 10.1109/STHERM.2003.1194350

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