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[IEEE NAECON 2010 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2010.07.14-2010.07.16)] Proceedings of the IEEE 2010 National Aerospace & Electronics Conference - Formalization of confidence levels in verification efforts

✍ Scribed by Radhakrishnan, Ramsundar; Gong, Fei; DeGroat, Joanne

Book ID: 115504421
Publisher: IEEE
Year: 2010
Weight: 358 KB
Volume: 0
Category: Article
ISBN: 1424465761
DOI: 10.1109/naecon.2010.5712962

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