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[IEEE NAECON 2010 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2010.07.14-2010.07.16)] Proceedings of the IEEE 2010 National Aerospace & Electronics Conference - Formal verification of layered sensing architectures

✍ Scribed by Tyler, Benjamin; Langdon, Adam; Chawla, Praveen

Book ID: 115503766
Publisher: IEEE
Year: 2010
Weight: 396 KB
Volume: 0
Category: Article
ISBN: 1424465761
DOI: 10.1109/naecon.2010.5712921

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