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[IEEE ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - Santa Barbara, CA, USA (May 23-26, 2005)] Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - The Field Charge Extraction (FCE) Diode A Novel Technology for Soft Recovery High Voltage Diodes

✍ Scribed by A. Kopta, M. Rahimo

Book ID: 111863869
Publisher: IEEE
Year: 2005
Weight: 885 KB
Volume: 0
Category: Article
ISBN-13: 9780780388901
DOI: 10.1109/ispsd.2005.1487956

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