[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - IS-FPGA : a new symmetric FPGA architecture with implicit scan

✍ Scribed by Renovell, M.; Faure, P.; Portal, J.M.; Figueras, J.; Zorian, Y.

• Book ID: 126279037
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 708 KB
• Category: Article
• ISBN-13: 9780780371699
• DOI: 10.1109/TEST.2001.966716