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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Minimizing power consumption in scan testing: pattern generation and DFT techniques

✍ Scribed by Butler, K.M.; Saxena, J.; Jain, A.; Fryars, T.; Lewis, J.; Hetherington, G.

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