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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - VirtualScan: a new compressed scan technology for test cost reduction

✍ Scribed by Wang, L.-T.; Xiaoqing Wen, ; Furukawa, H.; Fei-Sheng Hsu, ; Shyh-Horng Lin, ; Sen-Wei Tsai, ; Abdel-Hafez, K.S.; Shianling Wu,

Book ID: 118067053
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 727 KB
Volume: 0
Category: Article
ISBN-13: 9780780385801
DOI: 10.1109/test.2004.1387356

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