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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

✍ Scribed by Madge, R.; Benware, B.; Turakhia, R.; Daasch, R.; Schuermyer, C.; Ruffler, J.

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