✦ LIBER ✦

[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - Two-dimensional device simulation for avalanche induced short channel effect in poly-Si TFT

✍ Scribed by Yamada, S.; Yokoyama, S.; Koyanagi, M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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