✦ LIBER ✦

[IEEE International Technical Digest on Electron Devices Meeting - Washington, DC, USA (3-6 Dec. 1989)] International Technical Digest on Electron Devices Meeting - Integration of surface-micromachined zinc oxide sensors in n-well CMOS technology

✍ Scribed by Polla, D.L.; Yoon, H.; Tamagawa, T.; Voros, K.

No coin nor oath required. For personal study only.

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