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[IEEE International Symposium on Electromagnetic Compatibility - Atlanta, GA, USA (14-18 Aug. 1995)] Proceedings of International Symposium on Electromagnetic Compatibility - Multiple cable injection transient test system

✍ Scribed by Press, J.; Goldblum, C.; Damerau, E.; Komp, M.; Brent, D.; Smith, M.

Book ID: 126749026
Publisher: IEEE
Year: 1995
Weight: 412 KB
Category: Article
ISBN-13: 9780780325739
DOI: 10.1109/ISEMC.1995.523560

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