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[IEEE International Symposium on Electromagnetic Compatibility - Atlanta, GA, USA (14-18 Aug. 1995)] Proceedings of International Symposium on Electromagnetic Compatibility - Characteristics impedance of coupled microstrip lines

✍ Scribed by Bhattacharjee, P.S.; Das, S.; Chowdhury, S.K.

Book ID: 120261172
Publisher: IEEE
Year: 1995
Weight: 164 KB
Category: Article
ISBN-13: 9780780325739
DOI: 10.1109/ISEMC.1995.523533

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