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[IEEE International Semiconductor Device Research Symposium, 2003 - Washington, DC, USA (Dec. 10-12, 2003)] International Semiconductor Device Research Symposium, 2003 - Dual-gate (FinFet) and tri-gate MOSFETs: simulation and design

โœ Scribed by Breed, A.; Roeuker, K.P.


Book ID
121745416
Publisher
IEEE
Year
2003
Weight
105 KB
Category
Article
ISBN-13
9780780381391

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