𝔖 Bobbio Scriptorium

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[IEEE International Semiconductor Device Research Symposium, 2003 - Washington, DC, USA (Dec. 10-12, 2003)] International Semiconductor Device Research Symposium, 2003 - Numerical and experimental characterization of 4H-SiC Schottky diodes

✍ Scribed by Xiaohu Zhang, ; Goldsman, N.; Bemstein, J.B.; McGarrity, J.M.; Powell, S.K.

Book ID: 120713030
Publisher: IEEE
Year: 2003
Weight: 117 KB
Category: Article
ISBN-13: 9780780381391
DOI: 10.1109/ISDRS.2003.1272023

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