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[IEEE International Semiconductor Conference - Sinaia, Romania (8-12 Oct. 2002)] Proceedings. International Semiconductor Conference - Investigations on phosphosilicate glass by using IR, AFM and cluster model calculation

✍ Scribed by Bercu, M.; Moldovan, C.; Gavrila, R.; Bercu, B.N.; Ligor, O.

Book ID: 111954395
Publisher: IEEE
Year: 2002
Weight: 310 KB
Edition: 25
Volume: 2
Category: Article
ISBN-13: 9780780374409
DOI: 10.1109/smicnd.2002.1105849

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