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[IEEE 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Sinaia, Romania (9-12 Oct. 1996)] 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Porous silicon properties investigated by IR and UV-VIS spectrometry

✍ Scribed by Craciun, G.; Bercu, M.; Marica, L.; Bercu, C.; Dafinei, A.; Flueraru, C.; Grecu, V.V.

Book ID: 120680399
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 413 KB
Volume: 2
Category: Article
ISBN-13: 9780780332232
DOI: 10.1109/SMICND.1996.557475

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