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[IEEE 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Sinaia, Romania (9-12 Oct. 1996)] 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Experimental investigation of noise sources in silicon carbide Schottky barriers

✍ Scribed by Anghel, L.; Ouisse, T.; Billon, T.; Lassagne, P.; Jaussaud, C.

Book ID: 126749164
Publisher: IEEE
Year: 1996
Weight: 356 KB
Volume: 2
Category: Article
ISBN-13: 9780780332232
DOI: 10.1109/SMICND.1996.557436

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