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[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Ultra-thin gate dielectrics: they break down, but do they fail?

✍ Scribed by Weir, B.E.; Silverman, P.J.; Monroe, D.; Krisch, K.S.; Alam, M.A.; Alers, G.B.; Sorsch, T.W.; Timp, G.L.; Baumann, F.; Liu, C.T.; Ma, Y.; Hwang, D.

Book ID: 121487087
Publisher: IEEE
Year: 1997
Weight: 453 KB
Edition: 1997
Category: Article
ISBN-13: 9780780341005
DOI: 10.1109/IEDM.1997.649463

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