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[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Accurate thermal noise model for deep-submicron CMOS

✍ Scribed by Scholten, A.J.; Tromp, H.J.; Tiemeijer, L.F.; Van Langevelde, R.; Havens, R.J.; De Vreede, P.W.H.; Roes, R.F.M.; Woerlee, P.H.; Montree, A.H.; Klaassen, D.B.M.

Book ID: 120562230
Publisher: IEEE
Year: 1999
Weight: 321 KB
Category: Article
ISBN-13: 9780780354104
DOI: 10.1109/IEDM.1999.823868

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