[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - A high-speed silicon metal-semiconductor-metal photodetector fully integrable with (Bi)CMOS circuits

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✍ Slotboom, J.W.; Streutker, G.; van Dort, M.J.; Woerlee, P.H.; Pruijmboom, A.; Gr 📂 Article 📅 1991 🏛 IEEE ⚖ 299 KB

[IEEE International Electron Devices Mee

✍ Forman, R. 📂 Article 📅 1991 🏛 IEEE ⚖ 323 KB

[IEEE International Electron Devices Mee

✍ Busta, H.H.; Jenkins, D.W.; Zimmerman, B.J.; Pogemiller, J.E. 📂 Article 📅 1991 🏛 IEEE ⚖ 225 KB

[IEEE International Electron Devices Mee

✍ Carr, W.N.; Kim, J.M.; Zeto, R.J.; Zakar, E.S.; Mulford, C.D. 📂 Article 📅 1991 🏛 IEEE ⚖ 434 KB

[IEEE International Electron Devices Mee

✍ Levush, B.; Antonsen, T.; Bromborsky, A.; Lou, W.R.; Abe, D.; Miller, S.; Carmel 📂 Article 📅 1991 🏛 IEEE ⚖ 295 KB

[IEEE International Electron Devices Mee

✍ Antoniadis, D.A.; Chung, J.E. 📂 Article 📅 1991 🏛 IEEE ⚖ 397 KB