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[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Non-local impact ionization in silicon devices

✍ Scribed by Slotboom, J.W.; Streutker, G.; van Dort, M.J.; Woerlee, P.H.; Pruijmboom, A.; Gravesteijn, D.J.

Book ID: 124155474
Publisher: IEEE
Year: 1991
Weight: 299 KB
Category: Article
ISBN-13: 9780780302433
DOI: 10.1109/IEDM.1991.235484

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