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[IEEE International Conference on Field Programmable Logic and Applications, 2005. - Tampere, Finland (Aug. 24-26, 2005)] International Conference on Field Programmable Logic and Applications, 2005. - Yield modelling and yield enhancement for FPGAs using fault tolerance schemes

✍ Scribed by Campregher, N.; Cheung, P.Y.K.; Constantinides, G.A.; Vasilko, M.

Book ID: 118166170
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 261 KB
Volume: 0
Category: Article
ISBN-13: 9780780393622
DOI: 10.1109/fpl.2005.1515756

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