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[IEEE International Conference on Field Programmable Logic and Applications, 2005. - Tampere, Finland (Aug. 24-26, 2005)] International Conference on Field Programmable Logic and Applications, 2005. - Defect-tolerant fpga switch block and connection block with fine-grain redundancy for yield enhancement

✍ Scribed by Yu, A.J.; Lemieux, G.G.F.

Book ID: 115537927
Publisher: IEEE
Year: 2005
Weight: 432 KB
Volume: 0
Category: Article
ISBN-13: 9780780393622
DOI: 10.1109/fpl.2005.1515731

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