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[IEEE Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Portland, OR, USA (27-31 July 1997)] Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Quality improvement that improves patient satisfaction

✍ Scribed by Milosevic, D.Z.; Bayyigit, M.; Daim, T.

Book ID: 126713917
Publisher: IEEE
Year: 1997
Weight: 542 KB
Category: Article
ISBN-13: 9780780335745
DOI: 10.1109/PICMET.1997.653629

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