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[IEEE Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Portland, OR, USA (27-31 July 1997)] Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - TQM in maintenance to improve manufacturing performance

✍ Scribed by Sharp, J.M.; Irani, Z.N.; Wyant, T.; Firth, N.

Book ID: 126594820
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 424 KB
Category: Article
ISBN-13: 9780780335745
DOI: 10.1109/PICMET.1997.620779

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