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[IEEE Industrial Engineering (CIE-40) - Awaji City, Japan (2010.07.25-2010.07.28)] The 40th International Conference on Computers & Indutrial Engineering - Economic statistical design of x-bar control charts for correlated data and Gamma failure mechanism with genetic algorithm

✍ Scribed by Chen, Fei Long; Yeh, Li Lun

Book ID: 115544653
Publisher: IEEE
Year: 2010
Weight: 96 KB
Volume: 0
Category: Article
ISBN: 1424472954
DOI: 10.1109/iccie.2010.5668330

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